MarSurf | Contour measuring station

MarSurf CD 140 AF

产品货号 6269051

The entry into contour metrology from Mahr Fast and precise measurements - made possible by the unique new contour measuring device MarSurf CD 140 AF

MarSurf CD 140 AF
Speedy measurements
  • Short measuring times thanks to high positioning and measuring speeds
  • Space-saving measuring station for fast contour measurement
  • Quickly change the probe arm without tools thanks to a magnetic mount – no recalibration required
  • Measuring force selection prevents measurement errors


Flexible and versatile
  • Workpiece support plate with 25 mm travel path
  • Large measuring range of 70 mm for versatile use
  • Maximum handling flexibility thanks to support plate with 50 mm bore dimension
  • Wide selection of probe arms and accessory parts

Comprehensive software package
  • Measurement of double contours e.g., for determining diameters
  • Optional roughness measurement from Rz 2 µm possible
  • Simple and intuitive contour measurement and evaluation
  • Start Quick & Easy programs by importing DMC codes

MarSurf CD 140 AF | 产品编号 6269051
分辨率 20 nm
测量力 (N) 4 mN to 30 mN, software adjustable
测量速度 0.1 mm/s 到 10 mm/s
Positioning speed X-axis min. 0.1 mm/s
positioning speed X-axis max. 200 mm/s
定位速度 (mm/s),X 轴 0.1 - 200 mm/s
测头 Contour tracing system
重量(毛重) 35 KG
Workpiece weight max. 1.5 kg
其他 machine weight: 35 kg
测量范围 mm 70 mm with probe arm length 350 mm
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